• DocumentCode
    357585
  • Title

    Artificial loss in FDTD predictions of high-Q cavities

  • Author

    Birtcher, C. ; Georgakopoulos, S. ; Balanis, C.A.

  • Author_Institution
    Arizona State Univ., Tempe, AZ, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    16-21 July 2000
  • Firstpage
    1492
  • Abstract
    The penetration of electromagnetic fields into conducting enclosures via apertures is an EMI issue that is relevant to all of aviation. Although there are many possible mechanisms for the penetration of fields into an aircraft it is usually the windows which admit the greatest. Consequently, it is of greatest importance to understand and be able to predict the field penetration through apertures. Contrary to initial intuitive estimations this is not an entirely trivial problem for the finite difference time domain (FDTD) method. Particularly when the aperture is small relative to the size of the enclosure, the decay time of a pulsed excitation can be enormous. However, there may be some advantages to introducing an artificial loss mechanism into the problem space to accelerate the decay of the late-time fields.
  • Keywords
    Q-factor; aircraft; electromagnetic fields; electromagnetic interference; electromagnetic pulse; finite difference time-domain analysis; losses; EMI; EMP; FDTD method; FDTD predictions; aircraft; apertures; artificial loss; aviation; conducting enclosures; decay time; electromagnetic fields penetration; finite difference time domain method; high-Q cavities; late-time fields decay acceleration; pulsed excitation; windows; Acceleration; Aircraft navigation; Apertures; Electric variables measurement; Finite difference methods; Frequency measurement; Geometry; Message-oriented middleware; Polarization; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2000. IEEE
  • Conference_Location
    Salt Lake City, UT, USA
  • Print_ISBN
    0-7803-6369-8
  • Type

    conf

  • DOI
    10.1109/APS.2000.874488
  • Filename
    874488