• DocumentCode
    3578487
  • Title

    An assessment of single-particle effect in SRAM-based combinatorial coding

  • Author

    Li, Saiye ; Li, Lei

  • Author_Institution
    Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2014
  • Firstpage
    619
  • Lastpage
    622
  • Abstract
    In the space radiation environment, there are various cosmic rays and high-energy particles, which causing memory soft errors in memories. This is the single-particle flip effect, which is an important factor. It reduces the reliability of data transmission. In the radiation hardened design, the use of error correcting codes for reinforcement is an effective way to mitigate the single particle effect. In this paper, we analyze the bit error rate (BER) of the space and two major codings -Hamming code and BCH code. These two codings are employed to harden Static RAMs (SRAMs). These two codings´ space stability and resource consumption in specific spatial conditions is studied. These analysis results can be used to select an appropriate coding for SRAM reinforcement, and choose an appropriate SRAM refresh time in different space environment.
  • Keywords
    BCH codes; Hamming codes; SRAM chips; error statistics; BCH code; BER; Hamming code; SRAM reinforcement; SRAM-based combinatorial coding; bit error rate; cosmic rays; harden static RAM; high-energy particles; single-particle effect; space radiation environment; BCH code; Hamming code; SRAM reinforcement; Single Event Effects; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Problem-Solving (ICCP), 2014 IEEE International Conference on
  • Print_ISBN
    978-1-4799-4246-6
  • Type

    conf

  • DOI
    10.1109/ICCPS.2014.7062360
  • Filename
    7062360