DocumentCode
3578487
Title
An assessment of single-particle effect in SRAM-based combinatorial coding
Author
Li, Saiye ; Li, Lei
Author_Institution
Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2014
Firstpage
619
Lastpage
622
Abstract
In the space radiation environment, there are various cosmic rays and high-energy particles, which causing memory soft errors in memories. This is the single-particle flip effect, which is an important factor. It reduces the reliability of data transmission. In the radiation hardened design, the use of error correcting codes for reinforcement is an effective way to mitigate the single particle effect. In this paper, we analyze the bit error rate (BER) of the space and two major codings -Hamming code and BCH code. These two codings are employed to harden Static RAMs (SRAMs). These two codings´ space stability and resource consumption in specific spatial conditions is studied. These analysis results can be used to select an appropriate coding for SRAM reinforcement, and choose an appropriate SRAM refresh time in different space environment.
Keywords
BCH codes; Hamming codes; SRAM chips; error statistics; BCH code; BER; Hamming code; SRAM reinforcement; SRAM-based combinatorial coding; bit error rate; cosmic rays; harden static RAM; high-energy particles; single-particle effect; space radiation environment; BCH code; Hamming code; SRAM reinforcement; Single Event Effects; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Communication Problem-Solving (ICCP), 2014 IEEE International Conference on
Print_ISBN
978-1-4799-4246-6
Type
conf
DOI
10.1109/ICCPS.2014.7062360
Filename
7062360
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