DocumentCode
3590025
Title
Measuring Design-DK and true permittivity of PCB materials up to 20GHz
Author
Gold, G. ; Helmreich, K.
Author_Institution
Inst. of Microwaves & Photonics, Friedrich-Alexander-Univ. Erlangen-Nuremberg, Nuremberg, Germany
fYear
2015
Firstpage
154
Lastpage
157
Abstract
Many measurement methods for dielectric properties are influenced by surrounding conductor structures, which is especially significant in the case of copper cladded PCB materials. The paper explains the reasons for this, shows how to interpret data sheet values and introduces a measurement assembly and method that allows for precise determination of true relative permittivity and loss tangent. The presented assembly is customized for thin PCB material.
Keywords
dielectric loss measurement; microwave measurement; permittivity measurement; printed circuit design; printed circuit testing; Design-DK; copper cladded PCB materials; dielectric properties; loss tangent; thin PCB material; true relative permittivity; Cavity resonators; Conductors; Dielectrics; Permittivity; Permittivity measurement; Resonant frequency; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (GeMiC), 2015 German
Type
conf
DOI
10.1109/GEMIC.2015.7107776
Filename
7107776
Link To Document