• DocumentCode
    3594439
  • Title

    Enabling circuit design using FinFETs through close ecosystem collaboration

  • Author

    Sheu, Bing J. ; Chih-Sheng Chang ; Yen-Huei Chen ; Ken Wang ; Kuo-Ji Chen ; Yung-Chow Peng ; Li-Chun Tien ; Ming-Hsiang Song ; Hou, Chunping ; Sun, Jack Y.-C ; Chenming Hu

  • Author_Institution
    TSMC, Hsinchu, Taiwan
  • fYear
    2013
  • Abstract
    Double-patterning lithography is required at 20 nm node for planar CMOS. At the 16 / 14 nm node, in order to deliver attractive amount of Performance-Power-Area enhancement, 3-D FinFETs are required. Close collaboration at design ecosystem among fabrication foundry, EDA vendors, IP vendors, packaging vendors, and design houses is crucial for successful migration to FinFET circuits. This paper describes key issues in enabling circuit design using FinFETs and how to address them effectively.
  • Keywords
    CAD; CMOS integrated circuits; MOSFET; lithography; network synthesis; semiconductor device packaging; 3D FinFET circuit; CAD tool; EDA vendor; IP vendor; Performance-Power-Area enhancement; circuit design; close ecosystem collaboration; design ecosystem; double-patterning lithography; fabrication foundry; packaging vendor; planar CMOS; size 20 nm; CMOS integrated circuits; Doping; FinFETs; Integrated circuit modeling; Logic gates; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2013 Symposium on
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4673-5226-0
  • Type

    conf

  • Filename
    6576615