• DocumentCode
    3598435
  • Title

    Dimensional analysis of an open-ended coaxial-line probe

  • Author

    Bartley, Philip G., Jr. ; Nelson, Stuart O. ; McClendon, Ronald W.

  • Author_Institution
    Coll. of Eng. & Technol., Old Dominion Univ., Norfolk, VA, USA
  • Volume
    1
  • fYear
    2001
  • Firstpage
    478
  • Abstract
    Open-ended coaxial-line probes provide a convenient means of determining the dielectric properties of many materials over a relativity wide frequency range. Because of this, much attention has been given to understanding the interaction of the probe and the material it is inserted into. In this paper a dimensional analysis was performed on a generalized open-ended coaxial-line probe. Applying the Buckingham Π-theorem revealed that the admittance of the probe/dielectric interface, scaled by the frequency, is a function of a single dimensionless variable. This fact greatly simplifies the modeling of the probe. The problem is reduced from fitting a model of two variables, frequency and permittivity, to one dimensionless variable. In addition the dimensional analysis also revealed that the same results hold for any dielectric probe where the admittance of the probe is a function of permittivity, frequency and any number of linear dimensions
  • Keywords
    coaxial cables; electric admittance; microwave measurement; network analysers; permittivity measurement; probes; Buckingham PI-theorem; admittance; dielectric probe; dielectric properties measurement; dimensional analysis; dimensionless variable; network analyser; open-ended coaxial-line probes; parallel plate capacitor; permittivity; probe modeling; probe-material interaction; probe/dielectric interface; relativity wide frequency range; Admittance; Agricultural engineering; Coaxial components; Dielectric materials; Dielectric measurements; Electromagnetic analysis; Electromagnetic measurements; Frequency; Permittivity measurement; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.928864
  • Filename
    928864