• DocumentCode
    3599581
  • Title

    The influence of electrical impulse on IC transient radiation-induced effects

  • Author

    Chumakov, Alexander I. ; Skorobogatov, P.K. ; Artamonov, A.S. ; Barbashov, V.M.

  • fYear
    2003
  • Firstpage
    403
  • Lastpage
    406
  • Keywords
    CMOS integrated circuits; Circuit simulation; Computational modeling; Computer simulation; Failure analysis; Power supplies; Pulsed power supplies; System testing; Threshold voltage; Time factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442492
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3599581