DocumentCode
3604381
Title
Strain-Induced Modulation of Electron Mobility in Single-Layer Transition Metal Dichalcogenides MX2 (
, W; 

Author
Hosseini, Manouchehr ; Elahi, Mohammad ; Pourfath, Mahdi ; Esseni, David
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Volume
62
Issue
10
fYear
2015
Firstpage
3192
Lastpage
3198
Abstract
In this paper, the effect of biaxial strain on the mobility of single-layer transition metal dichalcogenides (MoS2, MoSe2, WS2, and WSe2) is investigated by accounting for the scattering from intrinsic phonon modes, remote phonons, and charged impurities. Ab initio simulations are employed to study a strain-induced effect on the electronic band structure, and the linearized Boltzmann transport equation is used to evaluate the low-field mobility. The results indicate that tensile strain increases the mobility. In particular, a significant increase in the mobility of single-layer MoSe2 and WSe2 with a relatively small tensile strain is observed. Under a compressive strain, however, the mobility exhibits a nonmonotonic behavior. With a relatively small compressive strain, the mobility decreases and then it partially recovers with a further increase in the compressive strain.
Keywords
ab initio calculations; band structure; chalcogenide glasses; compressive strength; electron mobility; impurities; internal stresses; molybdenum compounds; phonons; tensile strength; tungsten compounds; MoS2; MoSe2; W2S; WSe2; ab initio simulation; biaxial strain effect; compressive strain; electron mobility; electronic band structure; impurities; linearized Boltzmann transport equation; low-field mobility; nonmonotonic behavior; phonon modes; single-layer transition metal dichalcogenides; strain-induced effect; strain-induced modulation; tensile strain; Acoustics; Effective mass; Impurities; Phonons; Scattering; Tensile strain; Boltzmann transport equation (BTE); mobility; strain; transition metal dicalcogenides (TMDs); transition metal dicalcogenides (TMDs).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2461617
Filename
7182773
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