• DocumentCode
    3606818
  • Title

    Modeling of Radiation Effects in Silicon Photonic Devices

  • Author

    De Leonardis, Francesco ; Troia, Benedetto ; Campanella, Carlo Edoardo ; Prudenzano, Francesco ; Passaro, Vittorio M. N.

  • Author_Institution
    Dept. of Electr. & Inf. Eng., Politec. di Bari, Bari, Italy
  • Volume
    62
  • Issue
    5
  • fYear
    2015
  • Firstpage
    2155
  • Lastpage
    2168
  • Abstract
    The influence of high energy radiations on the performance of silicon-on-insulator photonic devices, such as straight waveguides, ring resonators and Raman lasers based on resonant microcavities, has been investigated theoretically in the near infrared. The modeling is based on a generalized full-vectorial wave equation system which also includes deep defect rate equations. Simulation results are compared with the state-of-the-art, demonstrating a very good agreement between theoretical predictions and experiments reported in literature in the case of both ionizing and nonionizing events. Moreover, a parametric analysis is presented in order to investigate the degradation mechanisms of photonic device performance that occur under the influence of radiation bombardment.
  • Keywords
    Raman lasers; radiation effects; Raman lasers; defect rate equations; degradation mechanisms; full-vectorial wave equation system; high energy radiation effect modeling; nonionizing events; parametric analysis; photonic device performance; radiation bombardment; resonant microcavities; ring resonators; silicon-on-insulator photonic devices; straight waveguides; Mathematical model; Nonlinear optics; Optical pumping; Optical waveguides; Silicon photonics; Modeling and theory; nonlinear optical effects; radiation effects; silicon photonics; stress effect; thermal effect; waveguide devices;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2469671
  • Filename
    7274496