DocumentCode
3608188
Title
Radiated spurious emission measurements using fast Fourier transform-based time domain scan
Author
Zhi Wei Sim ; Jian Song
Author_Institution
Rohde & Schwarz Asia Pte Ltd., Singapore, Singapore
Volume
9
Issue
7
fYear
2015
Firstpage
882
Lastpage
889
Abstract
In this study, the use of time domain (TD) scan based on fast Fourier transform technique for radiated spurious emission (RSE) measurements is investigated. Measurement time and results of TD scan are compared with those of conventional frequency sweep method. The RSE measurements carried out are based on two different wireless technologies, that is, GSM 900 and GSM 1800. The findings show that the TD scan can reduce overall RSE test time up to 86% with comparable measurement results.
Keywords
fast Fourier transforms; radiation detection; time-domain analysis; GSM 1800; GSM 900; RSE measurement; TD scan; fast Fourier transform; frequency sweep method; radiated spurious emission measurement; time domain scan; time measurement; wireless technology;
fLanguage
English
Journal_Title
Science, Measurement Technology, IET
Publisher
iet
ISSN
1751-8822
Type
jour
DOI
10.1049/iet-smt.2014.0333
Filename
7296735
Link To Document