• DocumentCode
    3611140
  • Title

    Industrial Development of High-Throughput Terahertz Time-Domain Spectroscopy

  • Author

    Nishina, Shigeki

  • Author_Institution
    Terahertz Syst. Bus. Div., Advantest Corp., Sendai, Japan
  • Volume
    5
  • Issue
    6
  • fYear
    2015
  • Firstpage
    1160
  • Lastpage
    1165
  • Abstract
    Considering measurement throughput is important for developing practical devices for nondestructive examinations that use terahertz waves. In the optical communications field, optical sampling technology is used to measure optical time division multiplexing, high-speed sweeping technology in terahertz wave spectroscopic devices, high throughput measurement, and other ultra-high-speed optical signals. In this study, we introduce terahertz wave analysis systems that utilize the terahertz optical sampling method. Furthermore, we provide measurement examples and describe industrial applications for terahertz waves.
  • Keywords
    nondestructive testing; optical communication; optical information processing; signal sampling; terahertz spectroscopy; time division multiplexing; time-domain analysis; high throughput measurement; high-speed sweeping technology; high-throughput terahertz time-domain spectroscopy; nondestructive examinations; optical communication field; optical sampling technology; optical time division multiplexing; terahertz optical sampling method; terahertz wave analysis systems; terahertz wave spectroscopic devices; ultrahigh-speed optical signals; High-speed optical techniques; Optical imaging; Optical pulses; Optical variables measurement; Sampling methods; Throughput; Time measurement; Optical sampling and high speed sweeping; terahertz; time-domain spectroscopy (TDS);
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • Filename
    7335436