Radiation Hardening of Voltage References Using Chopper Stabilization

Author

Shetler, K.J. ; Atkinson, N.M. ; Holman, W.T. ; Kauppila, J.S. ; Loveless, T.D. ; Witulski, A.F. ; Bhuva, B.L. ; Zhang, E.X. ; Massengill, L.W.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

62

Issue

6

fYear

2015

Firstpage

3064

Lastpage

3071

Abstract

A technique for enhancing the precision of voltage references in an ionizing radiation environment is presented. Radiation-induced mismatch is identified as a fundamental source of error in voltage reference topologies, and chopper offset cancellation is used to mitigate the effect. The efficacy of the proposed technique is demonstrated by irradiating test chips fabricated in a commercial 180-nm process.

Keywords

choppers (circuits); integrated circuit manufacture; integrated circuit testing; radiation hardening (electronics); reference circuits; chopper offset cancellation; chopper stabilization; ionizing radiation; radiation hardening; radiation-induced mismatch; size 180 nm; test chips fabricated; voltage reference topologies; Bipolar transistors; CMOS integrated circuits; Choppers (circuits); Operational amplifiers; Radiation effects; Radiation hardening (electronics); Voltage measurement; Analog/mixed-signal; chopper; offset cancellation; radiation; radiation-hardening by design (RHBD); total ionizing dose; voltage reference;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2015.2499171

Filename

7347469