• DocumentCode
    3615602
  • Title

    Adsorbed mass and resonant frequency fluctuations of a microcantilever caused by adsorption and desorption of particles of two gases

  • Author

    Z. Djuric;L. Jokic;M. Frantlovic;O. Jaksic;D. Vasiljevic-Radovic

  • Author_Institution
    Dept. of Microelectron. Technol. & Single Crystals, Inst. of Chem., Technol. & Metall., Belgrade, Serbia
  • Volume
    1
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    197
  • Abstract
    Microcantilever resonant frequency and mass fluctuation caused by adsorption and desorption of surrounding particles in a two-gas atmosphere are considered. Detailed derivations of mass fluctuation power spectral density and frequency fluctuation power spectral density are performed using analytical approach. The analogy between Shockley-Read generation-recombination processes of electrons in solids and adsorption-desorption processes of particles of a two gas atmosphere around the cantilever is shown. Simulation is given for a silicon microcantilever surrounded by nitrogen and hydrogen.
  • Keywords
    "Resonant frequency","Fluctuations","Gases","Atmosphere","Performance analysis","Electrons","Solids","Atmospheric modeling","Silicon","Nitrogen"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2004. 24th International Conference on
  • Print_ISBN
    0-7803-8166-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2004.1314592
  • Filename
    1314592