• DocumentCode
    3615958
  • Title

    Opportunities with the open architecture test system

  • Author

    K. Hatayama;R. Rajsuman; Cheng-Wen Wu;Y. Nishimura;S. Chakradhar;A. Merschon;D. Petrich;T. Tada

  • Author_Institution
    Renesas Technology
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    334
  • Lastpage
    334
  • Keywords
    "System testing","Research and development","Semiconductor device testing","Laboratories","Test equipment","Costs","Integrated circuit testing","Semiconductor device manufacture"
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
  • Print_ISBN
    0-7803-8175-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2004.1337591
  • Filename
    1337591
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3615958