• DocumentCode
    3619484
  • Title

    Projecting Device Lifetime for Scaling Technology Generations with the Quasi-Static model

  • Author

    A. Bravaix;D. Goguenheim;N. Revil;E. Vincent;P. Mortini

  • Author_Institution
    ISEM, Toulon, France
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    552
  • Lastpage
    555
  • Keywords
    "CMOS technology","Degradation","Isolation technology","MOSFETs","Stress","Helium","Hot carriers","Voltage","Transconductance","Power generation"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503611
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619484