• DocumentCode
    3619508
  • Title

    Prediction of MOS Matching in Weak and Moderate Inversion from Threshold Matching in Strong Inversion

  • Author

    M. Denison;A. Pergoot;M. Tack

  • Author_Institution
    Alcatel Microelectronics, Oudenaarde, Belgium
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    648
  • Lastpage
    651
  • Keywords
    "Threshold voltage","CMOS technology","Semiconductor device modeling","Performance evaluation","Testing","Temperature","Microelectronics","Transconductance","Electric resistance","MOSFETs"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503635
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619508