• DocumentCode
    3621536
  • Title

    Modeling and simulation compact models

  • Author

    K. Joardar; Jeong-Taek Kong

  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    199
  • Lastpage
    199
  • Keywords
    "Semiconductor device modeling","Circuit simulation","Frequency","Low-frequency noise","Joining processes","Circuit optimization","Nanoscale devices","Leakage current","Circuit noise","Temperature"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
  • Print_ISBN
    0-7803-9268-X
  • Type

    conf

  • DOI
    10.1109/IEDM.2005.1609305
  • Filename
    1609305
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3621536