• DocumentCode
    3623986
  • Title

    Role of Test in Yield Learning for 65nm and Beyond

  • Author

    Rene Segers

  • Author_Institution
    DfX Program manager, Philips Semiconductors
  • fYear
    2006
  • Firstpage
    1
  • Lastpage
    1
  • Keywords
    "Electrostatic discharge","Manufacturing processes","Semiconductor device manufacture","Semiconductor device testing","Timing","Fault diagnosis","Design for manufacture","Robustness","Electronic design automation and methodology","Lead compounds"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC ´06. IEEE International
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0291-3
  • Electronic_ISBN
    2378-2250
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297771
  • Filename
    4079449
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3623986