• DocumentCode
    3630538
  • Title

    Performance of electronically collimated SPECT imaging system in the energy range from 140 keV to 511 keV

  • Author

    E. Cochran;D. Burdette;E. Chesi;N. H. Clinthorne;K. Honscheid;S. S. Huh;H. Kagan;C. Lacasta;M. Mikuz;D. S. Smith;A. Studen;P. Weilhammer

  • Author_Institution
    Department of Physics, The Ohio State University, Columbus, USA
  • fYear
    2008
  • Firstpage
    4618
  • Lastpage
    4621
  • Abstract
    Conventional SPECT cameras rely on photon-absorbing collimators to collect spatial information on radioactive source distributions thereby coupling efficiency with spatial resolution in an inverse relationship as well as causing a rapid decrease in performance with increasing incident photon energy. The Compton SPECT imaging technique replaces the conventional collimator with a position sensitive scattering detector, or “electronic” collimator. This decouples the efficiency and spatial resolution of the system and also leads to increased performance for higher energy sources. However, new technical challenges are introduced in the form of high count rates, timing resolution requirements, and complexity in the image reconstruction. A prototype system using pixelated silicon as the position sensitive scattering detector has been built to quantify the benefits realized by a Compton camera for higher energy sources in the range from 99mTc (140 keV) to the positron annihilation energy (511 keV). In order to reduce some of the technical complexities of the conventional Compton camera arrangement, the initial prototype has been configured to effectively limit the image region to a two-dimensional “slice” geometry.
  • Keywords
    "Cameras","Spatial resolution","Single photon emission computed tomography","Electromagnetic scattering","Particle scattering","Position sensitive particle detectors","Prototypes","Optical collimators","High-resolution imaging","Timing"
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS ´08. IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4244-2714-7
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4774414
  • Filename
    4774414