• DocumentCode
    3631223
  • Title

    Transport and stability of doped freestanding silicon nanocrystals and MEH-PPV blends

  • Author

    Vladimir Svrcek;Hiroyuki Fujiwara;Michio Kondo

  • Author_Institution
    Novel Si Material Team, Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono 1-1-1, Tsukuba, 305-8568, JAPAN
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report on optoelectrical properties of freestanding silicon nanocrystals (Si-ncs) in poly[methoxy-ethylexyloxy-phenylenevinilene] (MEH-PPV). Electrochemical etching and pulverization of fine porous silicon films are used to prepare surfactant free boron- and phosphorous-doped Si-ncs with the same size distribution. We studied doped-Si-ncs/MEH-PPV blends with high concentrations of the Si-ncs in the matrix. A considerable increase of dark conductivity is observed when doped Si-ncs are introduced in the polymer. We find that the studied blends show a higher stability compared to pure polymer films. The results obtained can be explained by the reduction of the formation of carbonyl type groups in MEH-PPV and of the oxygen diffusion inside of the polymer matrix. Improved stability of the composites makes them as an attractive material for no-toxic solar cell production.
  • Keywords
    "Stability","Silicon","Nanocrystals","Etching","Semiconductor films","Conductivity","Polymer films","Composite materials","Photovoltaic cells","Production"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC ´08. 33rd IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922459
  • Filename
    4922459