DocumentCode
3631223
Title
Transport and stability of doped freestanding silicon nanocrystals and MEH-PPV blends
Author
Vladimir Svrcek;Hiroyuki Fujiwara;Michio Kondo
Author_Institution
Novel Si Material Team, Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono 1-1-1, Tsukuba, 305-8568, JAPAN
fYear
2008
Firstpage
1
Lastpage
4
Abstract
We report on optoelectrical properties of freestanding silicon nanocrystals (Si-ncs) in poly[methoxy-ethylexyloxy-phenylenevinilene] (MEH-PPV). Electrochemical etching and pulverization of fine porous silicon films are used to prepare surfactant free boron- and phosphorous-doped Si-ncs with the same size distribution. We studied doped-Si-ncs/MEH-PPV blends with high concentrations of the Si-ncs in the matrix. A considerable increase of dark conductivity is observed when doped Si-ncs are introduced in the polymer. We find that the studied blends show a higher stability compared to pure polymer films. The results obtained can be explained by the reduction of the formation of carbonyl type groups in MEH-PPV and of the oxygen diffusion inside of the polymer matrix. Improved stability of the composites makes them as an attractive material for no-toxic solar cell production.
Keywords
"Stability","Silicon","Nanocrystals","Etching","Semiconductor films","Conductivity","Polymer films","Composite materials","Photovoltaic cells","Production"
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC ´08. 33rd IEEE
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Type
conf
DOI
10.1109/PVSC.2008.4922459
Filename
4922459
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