DocumentCode
3632109
Title
Performance of rotated PSK over Nakagami-m fading channels
Author
Ahmet Yilmaz;Oguz Kucur
Author_Institution
Elektronik M?hendisli?i B?l?m?Gebze Y?ksek Teknoloji Enstit?s?, Turkey
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
876
Lastpage
879
Abstract
In this paper, the improvements in symbol error probability (SEP) / bit error probability (BEP) performances of rotated Phase Shift Keying (PSK) modulation are studied over Nakagami-m fading channels. Optimum rotation angles are obtained by the simulations, for different m values over frequency nonselective Nakagami-m slowly fading channels.
Keywords
"Phase shift keying","Fading","Error probability","Phase modulation","Frequency","Tellurium","Gaussian processes","Interleaved codes"
Publisher
ieee
Conference_Titel
Signal Processing and Communications Applications Conference, 2009. SIU 2009. IEEE 17th
ISSN
2165-0608
Print_ISBN
978-1-4244-4435-9
Type
conf
DOI
10.1109/SIU.2009.5136536
Filename
5136536
Link To Document