• DocumentCode
    3632696
  • Title

    Fault-Based Test Case Generation for Component Connectors

  • Author

    Bernhard K. Aichernig;Farhad Arbab;Lacramioara Astefanoaei;Frank S. de Boer;Meng Sun;Jan Rutten

  • Author_Institution
    IIST, UNU, Macao, China
  • fYear
    2009
  • Firstpage
    147
  • Lastpage
    154
  • Abstract
    The complex interactions appearing in service-oriented computing make coordination a key concern in service-oriented systems. In this paper, we present a fault-based method to generate test cases for component connectors from specifications. For connectors, faults are caused by possible errors during the development process, such as wrongly used channels, missing or redundant subcircuits, or circuits with wrongly constructed topology. We give test cases and connectors a unifying formal semantics by using the notion of design, and generate test cases by solving constraints obtained from the specification and faulty connectors. A prototype symbolic test case generator serves to demonstrate the automatizing of the approach.
  • Keywords
    "Connectors","System testing","Circuit faults","Circuit testing","Software testing","Prototypes","Large-scale systems","Software systems","Software engineering","Sun"
  • Publisher
    ieee
  • Conference_Titel
    Theoretical Aspects of Software Engineering, 2009. TASE 2009. Third IEEE International Symposium on
  • Print_ISBN
    978-0-7695-3757-3
  • Type

    conf

  • DOI
    10.1109/TASE.2009.14
  • Filename
    5198497