DocumentCode
3633295
Title
The contact resistance at interface of two different thick film layers
Author
Ivana Beshajova Pelikanova;Filip Slovak;Ales Duraj
Author_Institution
Department of Electrotechnology, Faculty of Electrical Engineering, CTU in Prague, CZ
fYear
2008
Firstpage
501
Lastpage
504
Abstract
The work is focused on analysis of interface of two different thick film layers. Contact resistance between conductive a resistive layers was measured and analyzed. Contact resistance is influenced by technology of deposition of layers, by conditions of curing, by materials and surface quality of substrate etc. Three point methods is used for measuring of contact resistance. This parameter was analyzed in dependence on geometry of contact area. Polymer thick film pastes were used for preparation of samples.
Keywords
"Contact resistance","Thick films","Electrical resistance measurement","Conductivity measurement","Curing","Conducting materials","Surface resistance","Substrates","Geometry","Polymer films"
Publisher
ieee
Conference_Titel
Electronics Technology, 2008. ISSE ´08. 31st International Spring Seminar on
ISSN
2161-2528
Print_ISBN
978-1-4244-3973-7;978-1-4244-3972-0
Electronic_ISBN
2161-2064
Type
conf
DOI
10.1109/ISSE.2008.5276617
Filename
5276617
Link To Document