DocumentCode
3635008
Title
Influence of cooling conditions on DC characteristics of the power MOS transistor IRF840
Author
Janusz Zarębski;Krzysztof Górecki
Author_Institution
Gdynia Maritime University, Department of Marine Electronics, Morska Str. 83, 81-225 Gdynia, Poland
fYear
2008
Firstpage
12
Lastpage
15
Abstract
In this paper some results of measurements of the dc characteristics of the power MOSFET IRF840 are presented. These characteristics were measured for ideal and real cooling conditions. The influence of selfheating on the output and transfer characteristics of the investigated device are shown and discussed.
Keywords
"Transistors","Heating","Voltage measurement","Temperature measurement","Temperature","Power measurement","Current measurement"
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Print_ISBN
978-966-553-678-9
Type
conf
Filename
5423593
Link To Document