• DocumentCode
    3635008
  • Title

    Influence of cooling conditions on DC characteristics of the power MOS transistor IRF840

  • Author

    Janusz Zarębski;Krzysztof Górecki

  • Author_Institution
    Gdynia Maritime University, Department of Marine Electronics, Morska Str. 83, 81-225 Gdynia, Poland
  • fYear
    2008
  • Firstpage
    12
  • Lastpage
    15
  • Abstract
    In this paper some results of measurements of the dc characteristics of the power MOSFET IRF840 are presented. These characteristics were measured for ideal and real cooling conditions. The influence of selfheating on the output and transfer characteristics of the investigated device are shown and discussed.
  • Keywords
    "Transistors","Heating","Voltage measurement","Temperature measurement","Temperature","Power measurement","Current measurement"
  • Publisher
    ieee
  • Conference_Titel
    Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
  • Print_ISBN
    978-966-553-678-9
  • Type

    conf

  • Filename
    5423593