• DocumentCode
    3637791
  • Title

    Towards Estimating Physical Properties of Embedded Systems using Software Quality Metrics

  • Author

    Ulisses Brisolara Corrêa;Luis Lamb;Luigi Carro;Lisane Brisolara;Júlio Mattos

  • Author_Institution
    Inst. de Inf., UFRGS, Porto Alegre, Brazil
  • fYear
    2010
  • Firstpage
    2381
  • Lastpage
    2386
  • Abstract
    The complexity of embedded devices poses new challenges to embedded software development in addition to the traditional physical requirements. Therefore, the evaluation of the quality of embedded software and its impact on these traditional properties becomes increasingly relevant. Concepts such as reuse, abstraction, cohesion, coupling, and other software attributes have been used as quality metrics in the software engineering domain. However, they have not been used in the embedded software domain. In embedded systems development, another set of tools is used to estimate physical properties such as power consumption, memory footprint, and performance. These tools usually require costly synthesis-and-simulation design cycles. In current complex embedded devices, one must rely on tools that can help design space exploration at the highest possible level, identifying a solution that represents the best design strategy in terms of software quality, while simultaneously meeting physical requirements. We present an analysis of the cross-correlation between software quality metrics, which can be extracted before the final system is synthesized, and physical metrics for embedded software. Using a neural network, we investigate the use of these cross-correlations to predict the impact that a given modification on the software solution will have on embedded software physical metrics. This estimation can be used to guide design decisions towards improving physical properties of embedded systems, while maintaining an adequate trade-off regarding software quality.
  • Keywords
    "Measurement","Artificial neural networks","Software quality","Embedded software","Embedded system","Books"
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology (CIT), 2010 IEEE 10th International Conference on
  • Print_ISBN
    978-1-4244-7547-6
  • Type

    conf

  • DOI
    10.1109/CIT.2010.409
  • Filename
    5578300