DocumentCode
3640549
Title
IEEE Standard 1149.1 Test Access Port And Boundary Scan Implementation In High Density CMOS Gate Arrays
Author
M. Reddy;Dandas Tang Dandas Tang;R. Jones
fYear
1992
fDate
6/14/1905 12:00:00 AM
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN
0-7803-0246-X
Type
conf
DOI
10.1109/CICC.1992.591297
Filename
5727345
Link To Document