DocumentCode
3648780
Title
Testable design of digital ASIC with embedded analog multiplexers
Author
S. Jankovic;D. Maksimovic;P. Petkovic;V. Litovski
Author_Institution
Fac. of Electron. Eng., Nis Univ., Serbia
Volume
2
fYear
1997
Firstpage
779
Abstract
This paper describes the design of a digital ASIC (Application Specific Integrated Circuit) with embedded analog multiplexers. The circuit is designed for a power-meter device. Additional circuitry is introduced to provide testability of both the digital and analog parts. After the design phase, the chip is fabricated and tested.
Keywords
"Application specific integrated circuits","Multiplexing","Switches","Circuit testing","Macrocell networks","Counting circuits","Integrated circuit packaging","Silicon","Design automation","Integrated circuit interconnections"
Publisher
ieee
Conference_Titel
Microelectronics, 1997. Proceedings., 1997 21st International Conference on
Print_ISBN
0-7803-3664-X
Type
conf
DOI
10.1109/ICMEL.1997.632961
Filename
632961
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