• DocumentCode
    3649223
  • Title

    Radiation Effect Characterization on the QorIQ P2010 Microprocessor

  • Author

    Damien Lambert;Xavier Vega;David Gauthier;Bruno Azaïs

  • Author_Institution
    Nucletudes, Courtaboeuf, France
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Upset susceptibilities are measured for the QorIQ P2010 Microprocessor. SEE cross-sections for protons (3.5 to 105 MeV) and heavy ions have been tested for registers and caches. Main characteristics of susceptibility are given.
  • Keywords
    "Microprocessors","Registers","Protons","Random access memory","Radiation effects","Cache memory","Ionization"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353712
  • Filename
    6353712
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3649223