• DocumentCode
    3653077
  • Title

    Polysilicon temperature sensor

  • Author

    Z. Bendekovic;P. Biljanovic;D. Grgec

  • Author_Institution
    Fac. of Electr. Eng. & Comput., Zagreb Univ., Croatia
  • Volume
    1
  • fYear
    1998
  • Firstpage
    362
  • Abstract
    Temperature dependence of polysilicon electrical resistance is investigated using existing polysilicon electrical conduction models. Conducted simulations showed the possibility of producing polysilicon resistors having a stable resistance on temperature dependence. A new polysilicon temperature sensor structure is proposed and processed according to optimal specifications. Measurements conducted on the processed samples showed that they have an almost linear resistance vs. temperature characteristic in a wide temperature range from 200 to 800 K.
  • Keywords
    "Temperature sensors","Electric resistance","Semiconductor process modeling","Grain size","Temperature dependence","Electrical resistance measurement","Temperature distribution","Microelectronics","Conductive films","Predictive models"
  • Publisher
    ieee
  • Conference_Titel
    Electrotechnical Conference, 1998. MELECON 98., 9th Mediterranean
  • Print_ISBN
    0-7803-3879-0
  • Type

    conf

  • DOI
    10.1109/MELCON.1998.692428
  • Filename
    692428