• DocumentCode
    3658047
  • Title

    Combinatorial Testing for Tree-Structured Test Models with Constraints

  • Author

    Takashi Kitamura;Akihisa Yamada;Goro Hatayama;Cyrille Artho;Eun-Hye Choi;Ngoc Thi Bich Do;Yutaka Oiwa;Shinya Sakuragi

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. &
  • fYear
    2015
  • Firstpage
    141
  • Lastpage
    150
  • Abstract
    In this paper, we develop a combinatorial testing technique for tree-structured test models. First, we generalize our previous test models for combinatorial testing based on AND-XOR trees with constraints limited to a syntactic subset of propositional logic, to allow for constraints in full propositional logic. We prove that the generalized test models are strictly more expressive than the limited ones. Then we develop an algorithm for combinatorial testing for the generalized models, and show its correctness and computational complexity. We apply a tool based on our algorithm to an actual ticket gate system that is used by several large transportation companies in Japan. Experimental results show that our technique outperforms existing techniques.
  • Keywords
    "Tunneling magnetoresistance","Credit cards","Testing","Vegetation","Integrated circuit modeling","Companies","Electronic mail"
  • Publisher
    ieee
  • Conference_Titel
    Software Quality, Reliability and Security (QRS), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/QRS.2015.29
  • Filename
    7272925