DocumentCode
3663095
Title
Strong large deviations for Rao test score and GLRT in exponential families
Author
Pierre Moulin;Patrick R. Johnstone
Author_Institution
University of Illinois at Urbana-Champaign, Beckman Inst., Coord. Sci. Lab, and Dept of ECE, 405 North Mathews Avenue, 61801 USA
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
779
Lastpage
783
Abstract
Exact asymptotics are derived for composite hypothesis testing between two product probability measures Pn vs Qn, subject to a type-I error-probability constraint ε. Here P is known but Q is an unknown element of a given d-dimensional regular exponential family. We study the Rao score test, which is a quadratic approximation to the GLRT. The type-II error probability is shown to vanish as equation where D and V are respectively the Kullback-Leibler divergence and the variance of information divergence between P and Q; τ(ε; d) is the 1 - ε quantile for the χd2 distribution; and the constants βd > 0 and γd are explicitly identified. The asymptotic regret relative to the Neyman-Pearson test (which knows Q) is reflected in the coefficient τ(ε; d), as is the cost of dimensionality. Looser asymptotics (with O(1) in place of εd) are obtained for the GLRT.
Keywords
"Error probability","Approximation methods","Testing","Random variables","Taylor series","Maximum likelihood estimation","Lattices"
Publisher
ieee
Conference_Titel
Information Theory (ISIT), 2015 IEEE International Symposium on
Electronic_ISBN
2157-8117
Type
conf
DOI
10.1109/ISIT.2015.7282561
Filename
7282561
Link To Document