A genetic algorithm based method for the uniformity of power in SoC during dynamic burn-in

It is desirable for an uniform power distribution in the chip during the dynamic burn-in, in which stimuli are inputted into the circuit under test. This paper uses the genetic algorithm to get an optimized input order of burn-in patterns for IP cores to approximate the uniformity of the power distribution in the SoC under the constraints of peak power and TAM width. The experimental results shows that the proposed method is effective on power uniformity for the fixed-width TAM SoC.