• DocumentCode
    3664824
  • Title

    Effect of stress on a bimorph piezoelectric micromachined ultrasound transducer

  • Author

    Marvin Tan Xing Haw;Liang Lou;Yuandong Alex Gu

  • Author_Institution
    Institute of Microelectronics, Agency for Science, Technology and Research (A∗
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    752
  • Lastpage
    755
  • Abstract
    A bimorph piezoelectric micromachined ultrasound transducer (pMUT) is presented. The bimorph comprises molybdenum and aluminum nitride (AlN) layers in both the top and bottom sections of the device. Residual stresses were included in both the top and bottom sections of the simulation model. Simulation results show that a progression from compressive to tensile stress leads to an increase in the fundamental resonant frequency of the pMUT. Deriving inspiration from Stoney´s equation, a mathematical model is proposed to extract the value of the residual stresses from the experimental data. The residual stresses obtained agree well with the hypothesized inverse relationship between the radius of curvature and the stress difference between the top and bottom sections of the pMUT.
  • Keywords
    "Conferences","Electron devices","Solid state circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4799-8362-9
  • Type

    conf

  • DOI
    10.1109/EDSSC.2015.7285226
  • Filename
    7285226