DocumentCode
3664824
Title
Effect of stress on a bimorph piezoelectric micromachined ultrasound transducer
Author
Marvin Tan Xing Haw;Liang Lou;Yuandong Alex Gu
Author_Institution
Institute of Microelectronics, Agency for Science, Technology and Research (A∗
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
752
Lastpage
755
Abstract
A bimorph piezoelectric micromachined ultrasound transducer (pMUT) is presented. The bimorph comprises molybdenum and aluminum nitride (AlN) layers in both the top and bottom sections of the device. Residual stresses were included in both the top and bottom sections of the simulation model. Simulation results show that a progression from compressive to tensile stress leads to an increase in the fundamental resonant frequency of the pMUT. Deriving inspiration from Stoney´s equation, a mathematical model is proposed to extract the value of the residual stresses from the experimental data. The residual stresses obtained agree well with the hypothesized inverse relationship between the radius of curvature and the stress difference between the top and bottom sections of the pMUT.
Keywords
"Conferences","Electron devices","Solid state circuits"
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN
978-1-4799-8362-9
Type
conf
DOI
10.1109/EDSSC.2015.7285226
Filename
7285226
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