• DocumentCode
    3664894
  • Title

    An improved K-means clustering algorithm for sleep stages classification

  • Author

    Xiao Shuyuan;Wang Bei;Zhang Jian;Zhang Qunfeng;Zou Junzhong;Masatoshi Nakamura

  • Author_Institution
    Department of Automation, School of Information Science and Engineering, East China University of Science and Technology, Shanghai, China
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1222
  • Lastpage
    1227
  • Abstract
    Sleep stage scoring is used to evaluate one´s overnight sleep process, which is important for clinical diagnosis. However, the visual inspection of sleep data is a laborious task and the scoring results may be subjective to different clinicians. The purpose of this paper is to develop an automatic sleep stage classification algorithm to reduce the artificial workload. The overnight sleep data are represented by the extracted features from time domain and frequency domain of EEG. An improved k-means clustering algorithm is proposed to classify overnight sleep data into five stages including awake (W), NREM (Non-Rapid Eye Movement) stage 1 (S1), NREM stage 2 (S2), slow-wave sleep (SS) and REM (Rapid Eye Movement). In the improved k-means clustering algorithm, the points with dense surrounding are selected as the original centers by using the concept of density for reference. Additionally, the cluster centers are updated according to `Three-Sigma Rule´ during the iteration. The determination of cluster center selection was developed which can be adaptive to the actual cases and abate the singular points effect. The obtained results showed that the accuracy of proposed algorithm was satisfied; especially it can distinguish W, SS and REM effectively. Furthermore, the improved k-means algorithm had less number of misclassification and higher accuracy than the original algorithm.
  • Keywords
    "Sleep","Clustering algorithms","Electroencephalography","Classification algorithms","Electrooculography","Feature extraction","Electromyography"
  • Publisher
    ieee
  • Conference_Titel
    Society of Instrument and Control Engineers of Japan (SICE), 2015 54th Annual Conference of the
  • Type

    conf

  • DOI
    10.1109/SICE.2015.7285326
  • Filename
    7285326