DocumentCode
3667383
Title
Phase-resolved characterization of nanostructured reflective infrared quarter-wave plate
Author
Wataru Nakagawa;Carol Baumbauer;Benjamin Moon;Orrin Boese;Jesse Lee;Skyler Rydberg;David L. Dickensheets
Author_Institution
Electrical and Computer Engineering Dept., Montana State University, Bozeman, 59717-3780 USA
fYear
2015
Firstpage
1
Lastpage
2
Abstract
Phase-resolved interferometric characterization of a nanostructured reflective quarter-wave plate for 1550 nm wavelength is presented. This device consists of a subwavelength-period grating in silicon with evaporated gold coating, and is compatible with standard fabrication processes.
Keywords
"Optical interferometry","Gratings","Gold","Optical retarders","Silicon","Optical device fabrication","Optical polarization"
Publisher
ieee
Conference_Titel
Optical MEMS and Nanophotonics (OMN), 2015 International Conference on
ISSN
2160-5033
Print_ISBN
978-1-4673-6834-6
Electronic_ISBN
2160-5041
Type
conf
DOI
10.1109/OMN.2015.7288888
Filename
7288888
Link To Document