• DocumentCode
    3667921
  • Title

    RF technology optimization by a fast method for linearity determination

  • Author

    T. V. Dinh;A. Vohra;J. Melai;T. Vanhoucke;P. H. C. Magnee;D. B. M. Klaassen

  • Author_Institution
    NXP Semiconductors Leuven, Interleuvenlaan 80, 3001, Belgium
  • fYear
    2015
  • Firstpage
    182
  • Lastpage
    185
  • Abstract
    This paper introduces a new methodology to determine the small signal linearity of a device directly from 2-port Y-parameters. With that approach, a 10-fold reduction of the simulation time in a comparison with traditional transient or harmonic balance simulations can be achieved, which enables a fast route for RF device and process technology optimization in an industrial environment. It is also shown that the linearity performance should be taken into account for the device optimization.
  • Keywords
    "Linearity","Radio frequency","Harmonic analysis","Optimization","Silicon germanium","Power system harmonics","Performance evaluation"
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4673-7858-1
  • Type

    conf

  • DOI
    10.1109/SISPAD.2015.7292289
  • Filename
    7292289