• DocumentCode
    3668466
  • Title

    Greatly improved carrier injection in GaN-based VCSEL by multiple quantum barrier electron blocking layer

  • Author

    Dan-Hua Hsieh;An-Jye Tzou;Da-Wei Lin;Tsung-Sheng Kao;Chien-Chung Lin;Chun-Yen Chang;Hao-Chung Kuo

  • Author_Institution
    Department of Photonic &
  • fYear
    2015
  • Firstpage
    139
  • Lastpage
    140
  • Abstract
    In this report, the fabrication and characteristics of III-nitride based vertical-cavity surface-emitting laser (VCSEL) with bulk AlGaN and AlGaN/GaN superlattice electron blocking layer (EBL) are observed experimentally and theoretically. The results have been revealed that laser performance is improved by using superlattice EBL. The output power and the slope efficiency are enhanced by the improvement of carrier injection into active region. And the reduction of threshold current density from 10 to 8 kA/cm2 is also observed. Theoretical calculation results suggest that the improved carrier injection efficiency can be mainly attributed to the partial release of the strain at the interface of last quantum barrier and superlattice EBL and hence the increase of electrons and holes effective barrier height.
  • Keywords
    "Vertical cavity surface emitting lasers","Gallium nitride","Aluminum gallium nitride","Wide band gap semiconductors","Charge carrier processes","Superlattices","Threshold current"
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on
  • ISSN
    2158-3234
  • Print_ISBN
    978-1-4799-8378-0
  • Type

    conf

  • DOI
    10.1109/NUSOD.2015.7292861
  • Filename
    7292861