DocumentCode
3671109
Title
The profilometer for ION beams
Author
S. Korenev;M. Musienko
Author_Institution
Siemens Healthcare, 810 Innovation Drive, Knoxville, TN 37932, USA
fYear
2015
fDate
5/1/2015 12:00:00 AM
Firstpage
1
Lastpage
6
Abstract
The concept of a real-time profilometer for ion beam is considered in this paper. The profilometer hardware is based on X-Y collector electrodes and the software based on LabVIEW from National Instruments. The software algorithm allows for statistical analysis and the visualization of beam current distribution. The concept of the profilometer was tested on the isochronous Eclipse Cyclotron produced by Siemens.
Keywords
"Electrodes","Data acquisition","Instruments","Ion beams","Cyclotrons","Current measurement","Hardware"
Publisher
ieee
Conference_Titel
Pulsed Power Conference (PPC), 2015 IEEE
ISSN
2158-4915
Electronic_ISBN
2158-4923
Type
conf
DOI
10.1109/PPC.2015.7297008
Filename
7297008
Link To Document