Multifunctional automated platform for determining spatial characteristics of optoelectronic devices

This paper presents an automated platform designed to allow a quick and accurate determination of the spatial characteristics of emitting and receiving optoelectronic devices. The platform can determine the radiation pattern of light emitting diodes (LEDs) and the sensitivity pattern of photodiodes (PDs) and phototransistors (PTs) and integrated photodetectors (IPD) as well. There are described the measurement method, the hardware that has been designed and the software that has been developed in order integrated photodetectors to achieve through an automated process the procedures needed for the spatial characterization of optoelectronic devices.