Estimation of crosstalk noise for RLC interconnects in deep submicron VLSI circuit

The modeling of interconnections is very much important, as the performance of VLSI circuit is limited by interconnect related failure modes, such as coupled noise and delay. Inductance along with capacitance causes noise in the signals, which may adversely affect the performance of the circuit and signal integrity. An analytical expression for crosstalk noise voltage is derived in this study using L model for RLC global interconnects in deep submicron VLSI circuit. Then the noise voltage is estimated by simulation using HSPICE. The result shows that the L model is good enough to compute crosstalk noise for RLC interconnects.