• DocumentCode
    3682315
  • Title

    A 0.02mm2 embedded temperature sensor with ±2°C inaccuracy for self-refresh control in 25nm mobile DRAM

  • Author

    Yeomyung Kim;Woojun Choi;Jaehoon Kim;Sanghoon Lee;Sangho Lee;Hyeongon Kim;Kofi A. A. Makinwa;Youngcheol Chae;Tae Wook Kim

  • Author_Institution
    Electrical and Electronic Engineering, Yonsei University, Seoul, Korea
  • fYear
    2015
  • Firstpage
    267
  • Lastpage
    270
  • Abstract
    This paper describes an all-CMOS embedded temperature sensor that directly controls the self-refresh period of a 25nm mobile DRAM. It occupies 0.02mm2, and achieves 0.04°C resolution and ±2°C accuracy from 20°C to 95°C after a single temperature trim. This performance is enabled by the use of dynamic threshold MOSFETs as temperature sensing devices, and by using chopping and trimming to mitigate the effects of device mismatch and process spread. The sensor consumes 9uW at a conversion rate of 7-kHz and a resolution of 50mK, which corresponds to a resolution FoM of 3.2pJK2. When used to control the self-refresh period of an 8GB mobile DRAM, the sensor reduces its standby current by 7x over a 20°C to 95°C range.
  • Keywords
    "Temperature sensors","Random access memory","Oscillators","Mobile communication","Clocks","Temperature measurement"
  • Publisher
    ieee
  • Conference_Titel
    European Solid-State Circuits Conference (ESSCIRC), ESSCIRC 2015 - 41st
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4673-7470-5
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2015.7313878
  • Filename
    7313878