• DocumentCode
    3683140
  • Title

    Active clamp design for on-chip GUN protection

  • Author

    Andreas Rupp;Ulrich Glaser;Yiqun Cao

  • Author_Institution
    Infineon Technologies AG, Am Campeon 1-12, 85579, Neubiberg, Germany
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    On-chip active clamps show attractive performance for the component-level ESD protection like HBM, but suffer usually from their weakness for short-pulse and high-current events like the first peak of IEC 61000-4-2 (GUN) pulses. This disadvantage can be overcome by adequate active clamp design, resulting in an area efficient active clamp GUN protection.
  • Keywords
    "Clamps","Electrostatic discharges","Logic gates","Robustness","Transient analysis","Capacitance","System-on-chip"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314778
  • Filename
    7314778