• DocumentCode
    3683144
  • Title

    EOS characterization methodology applied to disable feature of ESD power clamps

  • Author

    Jorge Loayza;Nicolas Guitard;Blaise Jacquier;Alexandre Dray;Divya Agarwal;Vicky Batra;Bruno Allard; Luong Viêt Phung

  • Author_Institution
    STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles Cedex FRANCE
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This work presents an EOS characterization methodology for ESD clamps. BigFET-based and SCR-based power clamps with and without disable feature are characterized. Thanks to the proposed characterization methodology, robustness comparison is provided for the different ESD clamps, giving insights on improving IC robustness against undesired triggering during EOS events.
  • Keywords
    "Clamps","Electrostatic discharges","Thyristors","Earth Observing System","Integrated circuits","Trigger circuits","Robustness"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314782
  • Filename
    7314782
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683144