• DocumentCode
    3683151
  • Title

    Practical methodology for the extraction of SEED models

  • Author

    Collin Reiman;Nicholas Thomson;Yang Xiu;Robert Mertens;Elyse Rosenbaum

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1308 W. Main St., 61801 USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A custom test board facilitates TLP characterization of the external pins of an integrated circuit. Models extracted from the data are used to simulate the pin-level response of the IC to an IEC 61000-4-2 discharge. ESD gun zaps are applied to the test board; simulated and measured waveforms are compared.
  • Keywords
    "Pins","Current measurement","Voltage measurement","Semiconductor device measurement","Transmission line measurements","Electrostatic discharges","Pulse measurements"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314789
  • Filename
    7314789
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683151