• DocumentCode
    3683165
  • Title

    S-parameter based modeling of system-level ESD test bed

  • Author

    Yang Xiu;Nicholas Thomson;Robert Mertens;Elyse Rosenbaum

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 61801 USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The IEC 61000-4-2 test bed is modeled with circuit elements extracted from S-parameter measurements. Simulated current waveforms are consistent with measurement for both battery operated and tethered equipment-under-test without customizing the model parameters for each case.
  • Keywords
    "Current measurement","Discharges (electric)","Integrated circuit modeling","Electrostatic discharges","Computational modeling","Scattering parameters","Data models"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314803
  • Filename
    7314803
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683165