• DocumentCode
    3687062
  • Title

    Software Intensity Function Prediction by Haar Wavelet Regression

  • Author

    Xiao Xiao

  • Author_Institution
    Dept. of Manage. Syst. Eng., Tokyo Metropolitan Univ., Hino, Japan
  • fYear
    2015
  • Firstpage
    182
  • Lastpage
    183
  • Abstract
    This paper proposes a semi-parametric model to predict the software intensity function of NHPP-based SRM. Haar wavelet is used to extract the features of the software intensity function from the observed software fault count data, and a simple quadratic function is used to predict the trend of the Haar coefficients. The prediction of the software intensity function is achieved by applying inverse Haar wavelet transform to the predicted Haar coefficients.
  • Keywords
    "Software","Software reliability","Estimation","Testing","Discrete wavelet transforms"
  • Publisher
    ieee
  • Conference_Titel
    Software Quality, Reliability and Security - Companion (QRS-C), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/QRS-C.2015.36
  • Filename
    7322141
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3687062