• DocumentCode
    3689043
  • Title

    Strain engineering of single-layer MoS2

  • Author

    Manouchehr Hosseini;Mohammad Elahi;Ebrahim Asl Soleimani;Mahdi Pourfath;David Esseni

  • Author_Institution
    School of Electrical and Computer Engineering, University of Tehran, Iran
  • fYear
    2015
  • Firstpage
    314
  • Lastpage
    317
  • Abstract
    In this work the effect of biaxial and uniaxial strain on the mobility of single-layer MoS2 at room temperatures is comprehensively studied. Scattering from intrinsic phonon modes, remote phonon and charged impurities are considered along with static screening. Ab-initio simulations are utilized to investigate the strain induced effects on the electronic bandstructure and the linearized Boltzmann transport equation is used to evaluate the low-field mobility under various strain conditions. The results indicate that the mobility increases with tensile biaxial and tensile uniaxial strain along the armchair direction. Under compressive strain, however, the mobility exhibits a nonmonotonic behavior when the strain magnitude is varied. In particular, with a relatively small compressive strain of 1% the mobility is reduced by about a factor of two compared to the unstrained condition, but with a larger compressive strain the mobility partly recovers such a degradation.
  • Keywords
    "Phonons","Uniaxial strain","Scattering","Impurities","Effective mass","Dielectrics"
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference (ESSDERC), 2015 45th European
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4673-7133-9
  • Electronic_ISBN
    2378-6558
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2015.7324777
  • Filename
    7324777