• DocumentCode
    3689044
  • Title

    Electric performance of AlGaN/GaN heterojunction devices: A full-quantum study

  • Author

    Luca Lucci;Jean-Charles Barb;Marco Pala

  • Author_Institution
    CEA Leti, MINATEC Campus 17, rue des Martyrs F-38054, Grenoble, France
  • fYear
    2015
  • Firstpage
    318
  • Lastpage
    321
  • Abstract
    In this contribution a full-quantum simulation of the electron transport in the two-dimensional electron gas (2DEG) of a AlGaN/GaN heterostructure is carried out using the non-equilibrium Green function (NEGF) approach. Even if electrical and mechanical properties of a AlGaN/GaN heterojunction are now well understood, a host of techniques like thinning of layers as in gate recess, use of advance materials like high-k dielectrics, introduction of back-barriers or channel interfaces, are considerably intricating the physical modeling of the heterojunction and precise simulations that correctly take into account for physical effects at the nano-scale are deemed necessary. In this study the quantum-mechanical effects in the electron transport layer properties are accounted for both in the quantization and in the transport direction. First, we focus in particular to a comparative study of the threshold voltage formation. We then we address the gate scaling, identifying the channel length at which short-channel-effects may be nonnegligible any more.
  • Keywords
    "Gallium nitride","Logic gates","Wide band gap semiconductors","Aluminum gallium nitride","MODFETs","HEMTs","Aluminum nitride"
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference (ESSDERC), 2015 45th European
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4673-7133-9
  • Electronic_ISBN
    2378-6558
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2015.7324778
  • Filename
    7324778