DocumentCode
3698599
Title
Session 3 — Optical interconnect and reliability enhancement techniques
Author
Tetsuya Iizuka;Takahiro Yamaguchi
Author_Institution
University of Tokyo
fYear
2015
Firstpage
1
Lastpage
1
Abstract
This session presents state-of-the-art electrical and optical concurrent design techniques for optical interconnect as well as reliability enhancement approaches for device aging.
Keywords
"Optical interconnections","Temperature measurement","Optical transmitters","Timing","Monitoring","Temperature sensors","Reliability"
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2015 IEEE
Type
conf
DOI
10.1109/CICC.2015.7338463
Filename
7338463
Link To Document