DocumentCode
3706356
Title
Study of quantized-energy effects in Si nanoscale lateral pn junction diodes
Author
S. Purwiyanti;H. N. Tan;D. Moraru;L. T. Anh;M. Manoharan;T. Mizuno;H. Mizuta;D. Hartanto;M. Tabe
Author_Institution
Research Institute of Electronics, Shizuoka University, Japan
fYear
2014
fDate
6/1/2014 12:00:00 AM
Firstpage
1
Lastpage
2
Abstract
In this work, we study SOI nanoscale pn junctions and find that transport characteristics are strongly affected by states of individual dopants and by quantized energy states. For pn diodes with lower doping concentration, we find that individual dopant atoms work as electron traps, inducing RTS in the diode current. On the other hand, for highly-doped pn diodes, quantization effects play critical roles in transport characteristics for both forward and reverse bias regimes.
Keywords
"Junctions","Doping","Nanoscale devices","Silicon","Quantization (signal)","Tunneling","Energy states"
Publisher
ieee
Conference_Titel
Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
Print_ISBN
978-1-4799-5676-0
Type
conf
DOI
10.1109/SNW.2014.7348593
Filename
7348593
Link To Document