• DocumentCode
    3706356
  • Title

    Study of quantized-energy effects in Si nanoscale lateral pn junction diodes

  • Author

    S. Purwiyanti;H. N. Tan;D. Moraru;L. T. Anh;M. Manoharan;T. Mizuno;H. Mizuta;D. Hartanto;M. Tabe

  • Author_Institution
    Research Institute of Electronics, Shizuoka University, Japan
  • fYear
    2014
  • fDate
    6/1/2014 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this work, we study SOI nanoscale pn junctions and find that transport characteristics are strongly affected by states of individual dopants and by quantized energy states. For pn diodes with lower doping concentration, we find that individual dopant atoms work as electron traps, inducing RTS in the diode current. On the other hand, for highly-doped pn diodes, quantization effects play critical roles in transport characteristics for both forward and reverse bias regimes.
  • Keywords
    "Junctions","Doping","Nanoscale devices","Silicon","Quantization (signal)","Tunneling","Energy states"
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
  • Print_ISBN
    978-1-4799-5676-0
  • Type

    conf

  • DOI
    10.1109/SNW.2014.7348593
  • Filename
    7348593