• DocumentCode
    3706362
  • Title

    Design and performance of nonvolatile SRAM cells based on pseudo-spin-FinFET architecture

  • Author

    Y. Shuto;S. Yamamoto;S. Sugahara

  • Author_Institution
    Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan., Kanagawa Academy of Science and Technology, Kawasaki, Japan
  • fYear
    2014
  • fDate
    6/1/2014 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we computationally investigated the operation and performance of NV-SRAM cells based on the PS-FinFET architecture. The NV-SRAM cells were carefully designed by taking into account various static noise margins (SNMs) (not only for normal SRAM operations but also for nonvolatile store and restore operations). The NVPG ability (energy performance) of the NV-SRAM cells was also investigated.
  • Keywords
    "Computer architecture","Microprocessors","Yttrium","FinFETs","Computer integrated manufacturing","Random access memory","Magnetic tunneling"
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
  • Print_ISBN
    978-1-4799-5676-0
  • Type

    conf

  • DOI
    10.1109/SNW.2014.7348599
  • Filename
    7348599